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Too Hot to Test 2021

February 9-11, 2021 – Online

As the industry moves to develop creative artificial intelligence (AI) and other advanced computing devices, the power consumption per semiconductor device has skyrocketed. This brings with it challenges in power deliver as well as device cooling. The virtual workshop Too Hot to Test will explore the cross-functional challenges associated with testing high-power devices. The focus will be on chips, die stacks, and multi-chip modules from both a thermal and power perspective.

Join us to learn what is possible and when a device really becomes Too Hot to Test!

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Known Good Die Workshop 2020

September 16 – 18, 2020 – 20th annual

With the demise of Moore’s Law due to the economics of advanced semiconductor process nodes, the demand for greater cost performance and differentiation has fueled the development of advanced packaging. Having Known Good Die (KGD) is essential for many, if not all, of the current ‘crop’ of advanced semiconductor packaging.

Join us at the Known Good Die Workshop for a cross-functional view of challenges and solutions for achieving KGD!