September 7, 2022 – Online
Today’s advanced packaging requires test engineers and product managers to think beyond the die. KGx (Known Good ____) starts with the architecture and product planning, needs to be supported by the design, and is delivered by the test and assembly operations. This requires new thinking and cross-functional approaches to test in the quest for KGx. Join us at the KGx Workshop on September 7, 2022 for a cross-functional view of challenges and solutions for achieving KGx starting with wafer quality!
Road to Chiplets – Design Integration
May 10 – 12, 2022 – Online
The semiconductor industry has come a long way from the days where the semiconductor die design / layout team simply passed the device off to another team to “handle” the packaging. Now there are packaging Design Integration (DI) teams who are responsible for “co-designing” the packaging and other processing while the chip is being designed. These teams resolve interdependencies, develop test vehicles, and manage risk to make sure there is a viable product.
As part of the MEPTEC Road to Chiplets series, we will discuss the role and challenges of DI in the upcoming storm of Chiplets. Properly implementing and developing methodologies to manage DI is essential to make Chiplets commercially viable.
Road to Chiplets –
Heterogeneous Integration Testability
March 15 & 16, 2022 – Online
Heterogeneous Integration (HI) of multiple semiconductor dies of different designs in a single advance package to increase functionality provides significant challenges to assembly and test today. As the concept of “Chiplets” – integrating an even larger number of die each smaller than a complete ‘standalone’ semiconductor device in a single package– gains traction these challenges will become even harder.
We will discuss the best-known methods (BKM) of Heterogeneous Integration Testability at Road to Chiplets – Heterogeneous Integration Testability.
Road to Chiplets – Data & Test
November 9 – 11, 2021 – Online
Data sharing and analysis of test results and other production ‘signals’ are critical enabling technologies to make Chiplet-based advanced packaging practical. To transition Chiplets from design of experiments and prototypes to commercial reality will require cross-functional data sharing across factories and suppliers. New data sources including new test steps and new ways of analyzing and sharing data are essential.
We will explore the new types of data and tests required to make products using a Chiplet approach practical at Road to Chiplets – Data & Test.
Chiplets Architecture 2021
July 13-14, 2021 – Online
The concept of “Chiplets” – integrating multiple die smaller than complete “stand alone” semiconductor devices using advanced packaging – has firmly captured the attention of the semiconductor industry. The foundational technologies to enable this advanced packaging have been explored in detailed at industry events. MEPTEC through a series of events will cover the practical aspects of designing, implementing (packaging), and testing Chiplets as this cross-functional knowledge is critical to transitioning such devices from science projects to commercial reality.
Join us as we focus on the high-level decisions that need to be made to implement a product using a Chiplet approach.
Supply Chain Security 2021
April 28-29, 2021 – Online
As the electronic content and complexity increases in all types of products it is essential to have a secure supply chain. The safety and security of these products rely directly on the semiconductor devices inside performing exactly as designed. The Supply Chain Security virtual workshop will explore the cross-functional issues facing packaging, test, and design engineers to ensure what is delivered contains the properly functioning original design and nothing more.
Join us to learn from experts in the commercial, military, and academic domains about Supply Chain Security.
Too Hot to Test 2021
February 9-11, 2021 – Online
As the industry moves to develop creative artificial intelligence (AI) and other advanced computing devices, the power consumption per semiconductor device has skyrocketed. This brings with it challenges in power deliver as well as device cooling. The virtual workshop Too Hot to Test will explore the cross-functional challenges associated with testing high-power devices. The focus will be on chips, die stacks, and multi-chip modules from both a thermal and power perspective.
Join us to learn what is possible and when a device really becomes Too Hot to Test!
Known Good Die Workshop 2020
September 16 – 18, 2020 – 20th annual -Online
With the demise of Moore’s Law due to the economics of advanced semiconductor process nodes, the demand for greater cost performance and differentiation has fueled the development of advanced packaging. Having Known Good Die (KGD) is essential for many, if not all, of the current ‘crop’ of advanced semiconductor packaging.
Join us at the Known Good Die Workshop for a cross-functional view of challenges and solutions for achieving KGD!